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Optical properties of porous silicon surface

✍ Scribed by E. Chambon; E. Florentin; T. Torchynska; J. González-Hernández; Y. Vorobiev

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
120 KB
Volume
36
Category
Article
ISSN
0026-2692

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## Abstract Porous silicon (PS) is doped with rare earth (RE) ions (Er, Eu, Tb) by electrochemical anodisation. The penetration of RE into the PS layer is confirmed by Rutherford Backscattering Spectroscopy (RBS) and by Energy Dispersive X‐ray (EDX) measurements. Efficient visible and infrared emis