Optical properties of GaN grown on porous silicon substrate
β Scribed by Boufaden, T. ;Matoussi, A. ;Guermazi, S. ;Juillaguet, S. ;Toureille, A. ;Mlik, Y. ;El Jani, B.
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 143 KB
- Volume
- 201
- Category
- Article
- ISSN
- 0031-8965
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Porous silicon (PSi) samples were prepared by electrochemical etching of silicon-on-insulator wafers, consisting of 45 m thick p-type (111) silicon epitaxial layer grown on a thin 100 nm SiO 2 layer on silicon substrates, by varying the concentration of 48% HF in ethanol solution. Within the epitaxi
## Abstract GaN nanoβceramics were analyzed using transmission electron microscopy (TEM), showing that these ceramics are characterized by highly disoriented grains of the linear size of 100β150 nm. These GaN ceramics were used as substrates for GaN epitaxy in standard MOVPE conditions. For the com