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Surface and interface topography of amorphous SiO 2 /crystalline Si(100) studied by X-ray diffraction

โœ Scribed by Brugemann, L; Bloch, R; Press, W; Gerlach, P


Book ID
120854288
Publisher
Institute of Physics
Year
1990
Tongue
English
Weight
706 KB
Volume
2
Category
Article
ISSN
0953-8984

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