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An investigation of the hydrogenated Si-SiO2 interface by X-ray diffraction

✍ Scribed by Rzhanov, A.E.; Filippov, V.I.; Chaplanov, V.A.; Yakimov, S.S.

Book ID: 122557862
Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 223 KB
Volume: 6
Category: Article
ISSN: 0167-577X
DOI: 10.1016/0167-577X(88)90094-8

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