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The growth and atomic structure of the Si(1 1 1)-indium interface studied by surface X-ray diffraction

✍ Scribed by M.S. Finney; C. Norris; P.B. Howes; M.A. James; J.E. Macdonald; A.D. Johnson; E. Vlieg


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
194 KB
Volume
198
Category
Article
ISSN
0921-4526

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