Surface and contact properties of GaN produced from GaAs
β Scribed by Dr. rer. nat. habil. H. Nieke; Dipl.-Phys. K. J. Rennert; A. Thoma
- Publisher
- John Wiley and Sons
- Year
- 1976
- Tongue
- English
- Weight
- 260 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0232-1300
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β¦ Synopsis
Abstract
Samples of some thickness and extent showed fine cracks on the brink already after oxidization in Ga~2~O~3~ which became more distinctive after nitriding into GaN. Currentβvoltage characteristics were recorded from different long nitrided samples with contacts of In, Sn, Sb, and Te. The long nitrided samples had a lower resistance. Some of the samples showed hysteresis effects with characteristics similar to varistors.
π SIMILAR VOLUMES
We have calculated band offsets of AlGaAs/GaAs and AlGaN/GaN systems using the recently reformulated tight binding method. The valence band offset (VBO) of the Al 0.2 Ga 0.8 As/GaAs system was obtained as 0.03 eV in agreement with the experimental value of 0.03 eV. The VBO for Al x Ga 1-x N/GaN is p