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Surface analysis of softened paper by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and the Kawabata evaluation system

✍ Scribed by M. Parfitt; J. C. Vickerman; R. Mitchell; C. M. Carr; N. Ince; P. Knight

Book ID: 110440280
Publisher: Springer
Year: 2003
Tongue: English
Weight: 127 KB
Volume: 38
Category: Article
ISSN: 0022-2461
DOI: 10.1023/a:1023728114543

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