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Surface analysis of emulsion adhesives by fast atom bombardment mass spectrometry and X-ray photoelectron spectroscopy

✍ Scribed by J. Comyn; D.C. Blackley; L.M. Harding

Book ID
103550558
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
545 KB
Volume
12
Category
Article
ISSN
0143-7496

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## Abstract A new technique using negative‐ion fast atom bombardment mass spectrometry for the analysis of xanthates and related compounds is described. Electron impact and positive‐ion fast atom bombardment mass spectrometry produced no structurally related fragment ions or observable molecular io