𝔖 Bobbio Scriptorium
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Combined Use of Atomic Force Microscopy, X-ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry for Cell Surface Analysis

✍ Scribed by Dague, Etienne; Delcorte, Arnaud; Latgé, Jean-Paul; Dufrêne, Yves F.

Book ID
126150266
Publisher
American Chemical Society
Year
2008
Tongue
English
Weight
264 KB
Volume
24
Category
Article
ISSN
0743-7463

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