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Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene

✍ Scribed by Chilkoti, Ashutosh; Castner, David G.; Ratner, Buddy D.


Book ID
115361661
Publisher
Society for Applied Spectroscopy
Year
1991
Tongue
English
Weight
875 KB
Volume
45
Category
Article
ISSN
0003-7028

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## Abstract The surface photochemistry of polystyrene is shown to exhibit features that distinguish it from the bulk and from the polymer in solution. We report on the use of medium‐ and high‐resolution time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy in an invest