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Characterization of metal surfaces by secondary ion mass spectrometry x-ray photoelectron spectroscopy

✍ Scribed by Hewitt, R. W.; Shepard, A. T.; Baitinger, W. E.; Winograd, Nicholas.; Ott, G. L.; Delgass, W. N.

Book ID: 121448427
Publisher: American Chemical Society
Year: 1978
Tongue: English
Weight: 566 KB
Volume: 50
Category: Article
ISSN: 0003-2700
DOI: 10.1021/ac50031a024

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