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Analysis of xanthates by negative-ion fast atom bombardment mass spectrometry

✍ Scribed by L. Fourie; H. G. Kruger

Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
228 KB
Volume
28
Category
Article
ISSN
1076-5174

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✦ Synopsis

Abstract

A new technique using negative‐ion fast atom bombardment mass spectrometry for the analysis of xanthates and related compounds is described. Electron impact and positive‐ion fast atom bombardment mass spectrometry produced no structurally related fragment ions or observable molecular ions at the expected m/z values. It was demonstrated that negative‐ion fast atom bombardment ionization was the most suitable method of ionization for structure elucidation studies for the compounds described.

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