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Suppression in negative bias illumination stress instability of zinc tin oxide transistor by insertion of thermal TiOx films

✍ Scribed by Lee, Chang-Kyu; Jung, Hong Yoon; Park, Se Yeob; Son, Byeong Geun; Lee, Chul-Kyu; Kim, Hyo Jin; Choi, Rino; Kim, Dae-Hwan; Bae, Jong-Uk; Shin, Woo-Sup; Jeong, Jae Kyeong

Book ID: 121687140
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 481 KB
Volume: 34
Category: Article
ISSN: 0741-3106
DOI: 10.1109/led.2012.2230242

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