✦ LIBER ✦
Negative-Bias Light Stress Instability Mechanisms of the Oxide-Semiconductor Thin-Film Transistors Using In–Ga-O Channel Layers Deposited With Different Oxygen Partial Pressures
✍ Scribed by Bak, Jun Yong; Yang, Shinhyuk; Ryu, Ho-Jun; Park, Sang Hee Ko; Hwang, Chi Sun; Yoon, Sung Min
- Book ID
- 121703457
- Publisher
- IEEE
- Year
- 2014
- Tongue
- English
- Weight
- 925 KB
- Volume
- 61
- Category
- Article
- ISSN
- 0018-9383
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