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Subthreshold drain leakage currents in MOS field-effect transistors

✍ Scribed by Gosney, W.M.

Book ID: 114590238
Publisher: IEEE
Year: 1972
Tongue: English
Weight: 602 KB
Volume: 19
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1972.17399

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