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Substrate current measurements in thin SOI MOSFET's at 300 and 77 K

✍ Scribed by Kistler, N.; Woo, J.; Viswanathan, C.R.; Terril, K.; Vasudev, P.K.


Book ID
114534745
Publisher
IEEE
Year
1991
Tongue
English
Weight
266 KB
Volume
38
Category
Article
ISSN
0018-9383

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