Back-gate bias effect on the subthreshold behavior and the switching performance in an ultrathin SOI CMOS inverter operating at 77 and 300 K

✍ Scribed by Kuo, J.B.; Lee, W.C.; Sim, J.-H.

• Book ID: 114534950
• Publisher: IEEE
• Year: 1992
• Tongue: English
• Weight: 848 KB
• Volume: 39
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.168724