Back gatebias effects on the pull-down transient behavior in an ultra-thin SOI CMOS inverter operating at 300 K and 77 K

✍ Scribed by J.B. Kuo; W.C. Lee; J.H. Sim

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 305 KB
• Volume: 35
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(92)90098-w