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Submicron SOI-MOSFETs for high temperature operation (300–600K)

✍ Scribed by G. Reichert; C. Raynaud; O. Faynot; F. Balestra; S. Cristoloveanu


Book ID
104306452
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
265 KB
Volume
36
Category
Article
ISSN
0167-9317

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Diffusion model for high-temperature off
✍ T.E. Rudenko; V.I. Kilchitskaya; A.N. Rudenko 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 281 KB

In this paper off-state drain currents in long-channel inversion mode SOI MOSFETs are investigated in the range 50-320°C by measurements and simulations. The behavior of high-temperature (T>200°C) off-state currents is interpreted in terms of diffusion model, based on the analysis of carrier distrib