✦ LIBER ✦
Investigation of Temperature-Dependent High-Frequency Noise Characteristics for Deep-Submicrometer Bulk and SOI MOSFETs
✍ Scribed by Sheng-Chun Wang; Pin Su; Kun-Ming Chen; Bo-Yuan Chen; Guo-Wei Huang
- Book ID
- 114620821
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 853 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0018-9383
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