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Study of Transport and Dielectric of Resistive Memory States in NiO Thin Film

✍ Scribed by Kim, Min Gyu; Kim, Sun Man; Choi, Eun Jip; Moon, Seung Eon; Park, Jonghyurk; Kim, Hyoung Chan; Park, Bae Ho; Lee, Myoung Jae; Seo, Sunae; Seo, David H.; Ahn, Seung Eun; Yoo, In Kyeong

Book ID: 125829171
Publisher: Institute of Pure and Applied Physics
Year: 2005
Tongue: English
Weight: 205 KB
Volume: 44
Category: Article
ISSN: 0021-4922
DOI: 10.1143/JJAP.44.L1301

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