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Effects of metal electrodes on the resistive memory switching property of NiO thin films

โœ Scribed by Lee, C. B.; Kang, B. S.; Benayad, A.; Lee, M. J.; Ahn, S.-E.; Kim, K. H.; Stefanovich, G.; Park, Y.; Yoo, I. K.


Book ID
127193344
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
554 KB
Volume
93
Category
Article
ISSN
0003-6951

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