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Resistive-Switching Memory Effects of NiO Nanowire/Metal Junctions

✍ Scribed by Oka, Keisuke; Yanagida, Takeshi; Nagashima, Kazuki; Kawai, Tomoji; Kim, Jin-Soo; Park, Bae Ho

Book ID: 126976061
Publisher: American Chemical Society
Year: 2010
Tongue: English
Weight: 401 KB
Volume: 132
Category: Article
ISSN: 0002-7863
DOI: 10.1021/ja101742f

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