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Study of the influence of the nonequilibrium point defect concentration gradient on the dopant flux during ion implantation in silicon at high temperatures

โœ Scribed by V.I. Kol'dyaev


Book ID
118400061
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
812 KB
Volume
103
Category
Article
ISSN
0168-583X

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