X-ray diffraction study of the effect of neutron irradiation on the defect formation in silicon crystals grown by the Czochralski method and annealed at high temperatures

✍ Scribed by V. A. Makara; N. N. Novikov; B. D. Patsai

• Book ID: 110144256
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2005
• Tongue: English
• Weight: 85 KB
• Volume: 47
• Category: Article
• ISSN: 1063-7834
• DOI: 10.1134/1.2087738