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Study of temperature dependence of positive charge generation in thin dielectric film of MOS structure under high-fields

✍ Scribed by G.G. Bondarenko; V.V. Andreev; V.E. Drach; S.A. Loskutov; M.A. Stolyarov

Book ID: 108289304
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 201 KB
Volume: 515
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2005.12.236

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