✦ LIBER ✦
Charge instability in mis structures with dielectric silicon dioxide-phosphoro-silicate glass layers under conditions of high-field tunnel injection
✍ Scribed by G. G. Bondarenko; V. V. Andreev; V. G. Baryshev; A. A. Stolyarov
- Publisher
- Springer
- Year
- 1999
- Tongue
- English
- Weight
- 367 KB
- Volume
- 42
- Category
- Article
- ISSN
- 1573-9228
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