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Sign of the charge accumulated in thermal SiO2 films of silicon MIS structures under high electric field condition

✍ Scribed by Mikhailovskii, I. P. ;Potapov, P. B. ;Epov, A. E.

No coin nor oath required. For personal study only.

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Charge instability in mis structures wit

✍ G. G. Bondarenko; V. V. Andreev; V. G. Baryshev; A. A. Stolyarov 📂 Article 📅 1999 🏛 Springer 🌐 English ⚖ 367 KB