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Study of oxidation process of Cr/Cu/Cr thin film electrodes

✍ Scribed by Junlin Yuan; Weixiang Weng; Zhilong Lin Tailiang Guo


Book ID
108191676
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
521 KB
Volume
70
Category
Article
ISSN
0022-3697

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Thin films of Ni-Cr were electron-beam-evaporated and subsequently annealed in air or in vacuum. Their depth profile was analysed by Auger electron spectroscop~. The film/substrata and the film/air interfaces were studied in order to shed light on contributing factors to adhesion and the mechanism o