✦ LIBER ✦

Scanning electrical resistometry (SER) of Cr thin film oxidation

✍ Scribed by A Cvelbar; B Čuk; P Panjan; B Navinšek; A Zalar

Book ID: 103471936
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 455 KB
Volume: 46
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(95)00073-9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Study of oxidation process of Cr/Cu/Cr t

Study of oxidation process of Cr/Cu/Cr thin film electrodes

✍ Junlin Yuan; Weixiang Weng; Zhilong Lin Tailiang Guo 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 521 KB

Electrical Properties of Cr - Al Alloy T

Electrical Properties of Cr - Al Alloy Thin Films

✍ Ozawa, P.; Yoshizaki, S.; Takeyama, S.; Enjo, T.; Ikeuchi, K. 📂 Article 📅 1986 🏛 IEEE 🌐 English ⚖ 659 KB

Electrical and structural properties of

Electrical and structural properties of Cr-SiO thin films

✍ V. Fronz; B. Rösner; W. Storch 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 530 KB

Electrical properties of thin oxidized a

Electrical properties of thin oxidized aluminium films

✍ F. M. Reicha; M. A. Hiti; P. B. Barna 📂 Article 📅 1991 🏛 Springer 🌐 English ⚖ 475 KB

Electrical properties of thulium oxide t

Electrical properties of thulium oxide thin films

✍ T. Zdanowicz 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 321 KB

The mechanism of oxidation of thin Ni−Cr

The mechanism of oxidation of thin Ni−Cr films

✍ I.E. Klein; M. Hershkovich; I.A. Goldberg 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 264 KB

Thin films of Ni-Cr were electron-beam-evaporated and subsequently annealed in air or in vacuum. Their depth profile was analysed by Auger electron spectroscop~. The film/substrata and the film/air interfaces were studied in order to shed light on contributing factors to adhesion and the mechanism o