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Study of MOS gate dielectric breakdown due to drain avalanche breakdown

✍ Scribed by H. Wong; M.C. Poon

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Reversible dielectric breakdown of thin

✍ J. Suñé; M. Nafría; X. Aymerich 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 493 KB

Avalanche Breakdown Due to 3-D Effects i

✍ Mayer, F.; Le Royer, C.; Blachier, D.; Clavelier, L.; Deleonibus, S. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 593 KB

Analysis and modeling of the gate leakag

✍ E. Miranda; T. Kawanago; K. Kakushima; J. Suñé; H. Iwai 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 526 KB

Dielectric breakdown due to ionization o

✍ N. S. Il'chenko; A. V. Kovalev; G. I. Gavrilyuk 📂 Article 📅 1966 🏛 Springer 🌐 English ⚖ 418 KB

Breakdown and reliability of p-MOS devic

✍ Yi-Mu Lee; Yider Wu; Gerald Lucovsky 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 660 KB

Dielectric breakdown of thick thermosett

✍ T. Nakakita 📂 Article 📅 1974 🏛 John Wiley and Sons 🌐 English ⚖ 515 KB