✦ LIBER ✦
Avalanche Breakdown Due to 3-D Effects in the Impact-Ionization MOS (I-MOS) on SOI: Reliability Issues
✍ Scribed by Mayer, F.; Le Royer, C.; Blachier, D.; Clavelier, L.; Deleonibus, S.
- Book ID
- 114619421
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 593 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0018-9383
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