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Study of microstructure of high stability hydrogenated amorphous silicon films by Raman scattering and infrared absorption spectroscopy

✍ Scribed by Sheng, Shuran; Liao, Xianbo; Kong, Guanglin; Han, Hexiang


Book ID
118045304
Publisher
American Institute of Physics
Year
1998
Tongue
English
Weight
383 KB
Volume
73
Category
Article
ISSN
0003-6951

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