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Temperature and orientation study of cobalt phthalocyanine CoPc thin films deposited on silicon substrate as studied by micro-Raman scattering spectroscopy

✍ Scribed by M. Szybowicz; W. Bała; S. Dümecke; K. Fabisiak; K. Paprocki; M. Drozdowski

No coin nor oath required. For personal study only.

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