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Study of microstructure of amorphous Ge-Se films using spectroscopic ellipsometry

✍ Scribed by Satyendra Kumar; D.K. Pandya; K.L. Chopra

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 315 KB
Volume: 164
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(88)90108-3

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