Ion irradiation induced surface modifica
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A. Tripathi; Amit Kumar; F. Singh; D. Kabiraj; D.K. Avasthi; J.C. Pivin
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Article
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2005
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Elsevier Science
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English
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Various types of scanning probe microscopy (SPM) techniques: atomic force microscopy (AFM) (contact and tapping in height and amplitude mode), scanning tunnelling microscopy (STM) and conducting atomic force microscopy (C-AFM) are used for studying ion beam induced surface modifications, nanostructu