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Comparative study of 3D measurement techniques (SPM, SEM, TEM) for submicron structures

โœ Scribed by Henri R.J.R. van Helleputte; Theo B.J. Haddeman; Martin J. Verheijen; Jan-Jaap Baalbergen


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
232 KB
Volume
27
Category
Article
ISSN
0167-9317

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