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Study of interface trap properties in MOSFETs using split-current measurements

✍ Scribed by Mohamed El-Sayed; Hisham Haddara

Book ID: 103394757
Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 565 KB
Volume: 34
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(91)90085-d

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