✦ LIBER ✦
Conductance technique in MOSFETs: Study of interface trap properties in the depletion and weak inversion regimes
✍ Scribed by Hisham S. Haddara; Mohamed El-Sayed
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 807 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0038-1101
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