Surface hydrogen and growth mechanisms are investigated for synchrotron radiation (SR)assisted gas source molecular beam epitaxy (SR-GSMBE) using Si 2 H 6 on the Si(100) surface in the low-temperature region. The surface silicon hydrides (deuterides) are monitored in situ during the epitaxial growth
โฆ LIBER โฆ
Study of growth kinetics in silicon gas source molecular beam epitaxy with disilane using RHEED intensity oscillations
โ Scribed by S. Butzke; K. Werner; J. Trommel; S. Radelaar; P. Balk
- Book ID
- 107864282
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 431 KB
- Volume
- 228
- Category
- Article
- ISSN
- 0040-6090
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The value of in situ monitoring to study growth dynamics and surface reaction kinetics in a gas source molecular beam epitaxy process is illustrated with reference to the growth of Si ยฎlms on Si(001) substrates using a beam of disilane (Si 2 H 6 ). By using a combination of reยฏection high-energy ele
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