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Study of ferroelectric-thin-film thickness effects on metal-ferroelectric-SiO[sub 2]âSi transistors

✍ Scribed by Lin, Yih-Yin; Singh, Jasprit

No coin nor oath required. For personal study only.

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Study of ferroelectric-thin-film thickness effects on metal-ferroelectric-SiO[sub 2]âSi transistors