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Large anisotropy of ferroelectric and dielectric properties for Bi[sub 3.15]Nd[sub 0.85]Ti[sub 3]O[sub 12] thin films deposited on Pt∕Ti∕SiO[sub 2]∕Si

✍ Scribed by Lu, C. J.; Qiao, Y.; Qi, Y. J.; Chen, X. Q.; Zhu, J. S.


Book ID
120254494
Publisher
American Institute of Physics
Year
2005
Tongue
English
Weight
656 KB
Volume
87
Category
Article
ISSN
0003-6951

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