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Study of electrical and micro-structural properties of high-κ gate dielectric stacks deposited using pulse laser deposition for MOS capacitor applications

✍ Scribed by Srivastava, A.; Mangla, O.; Nahar, R. K.; Gupta, V.; Sarkar, C. K.


Book ID
125362792
Publisher
Springer US
Year
2014
Tongue
English
Weight
982 KB
Volume
25
Category
Article
ISSN
0957-4522

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