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Structural and dielectric properties of Bi2Zn2/3Nb4/3O7 thin films prepared by pulsed laser deposition at low temperature for embedded capacitor applications

✍ Scribed by Xiaohua Zhang; Wei Ren; Peng Shi; M. Saeed Khan; Xiaofeng Chen; Xiaoqing Wu; Xi Yao

No coin nor oath required. For personal study only.

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