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Study of defects in thin titanium films by positron annihilation spectroscopy

โœ Scribed by M Misheva; N Djourelov; Tzv Kotlarova; D Elenkov; G Passage


Book ID
107864867
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
311 KB
Volume
283
Category
Article
ISSN
0040-6090

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Positron Annihilation Spectroscopy (PAS) performed with continuous and pulsed positron beams allows to characterize the size of the intrinsic nano-voids in silica glass, their in depth modification after ion implantation and their decoration by implanted ions. Three complementary PAS techniques, lif