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Irradiation-induced defects in ZnO studied by positron annihilation spectroscopy

✍ Scribed by Tuomisto, F. ;Saarinen, K. ;Look, D. C.


Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
85 KB
Volume
201
Category
Article
ISSN
0031-8965

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Irradiation-induced defects in InN and G
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## Abstract We use positron annihilation to study 2‐MeV ^4^He^+^ irradiated and subsequently rapid‐thermal‐annealed InN grown by molecular‐beam epitaxy and GaN grown by metal‐organic chemical‐vapour deposition. The irradiation fluences were in the range 5 × 10^14^–2 × 10^16^ cm^βˆ’2^. In vacancies ar