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Positron-Annihilation-Spectroscopy Study of Proton-Induced Defects in Silicon

✍ Scribed by V. I. Grafutin; O. V. Ilyukhina; G. G. Myasishcheva; V. V. Kalugin; E. P. Prokopiev; S. P. Timoshenkov; N. O. Khmelevskii; Yu. V. Funtikov

Publisher: Springer
Year: 2005
Tongue: English
Weight: 79 KB
Volume: 34
Category: Article
ISSN: 1063-7397
DOI: 10.1007/s11180-005-0027-2

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