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Structure, Energetics, and Thermal Stability of Nitrogen-Vacancy-Related Defects in Nitrogen Doped Silicon

✍ Scribed by Karoui, A.; Karoui, F. Sahtout; Rozgonyi, G. A.; Hourai, M.; Sueoka, K.

Book ID: 125479372
Publisher: The Electrochemical Society
Year: 2003
Tongue: English
Weight: 308 KB
Volume: 150
Category: Article
ISSN: 0013-4651
DOI: 10.1149/1.1621418

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