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Structure Characterization of Porous Silicon Layers Based on a Theoretical Analysis

โœ Scribed by Xiao, Caide; Boukherroub, Rabah; Wojtyk, James T. C.; Wayner, Danial D. M.; Luong, John H. T.

Book ID
126201051
Publisher
American Chemical Society
Year
2002
Tongue
English
Weight
118 KB
Volume
18
Category
Article
ISSN
0743-7463

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