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Structure and hydrogen content of polymorphous silicon thin films studied by spectroscopic ellipsometry and nuclear measurements

✍ Scribed by Fontcuberta i Morral, A.; Roca i Cabarrocas, P.; Clerc, C.

Book ID: 123620659
Publisher: The American Physical Society
Year: 2004
Tongue: English
Weight: 137 KB
Volume: 69
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.69.125307

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